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发明公开
CN105182265A 一种计量芯片选型测试系统 无效 - 驳回

一种计量芯片选型测试系统
摘要：
本发明公开一种计量芯片选型测试系统，该系统包括功率源、采集模块、计量芯片测试模块、数控电源模块、通讯模块、微处理器、接口转换模块和PC机测试系统；所述微处理器分别与通讯模块、接口转换模块和数控电源模块相连；所述计量芯片测试模块分别与采集模块、数控电源模块和接口转换模块相连；所述功率源分别与通讯模块、数控电源模块和采集模块相连。本发明通用的计量芯片测试装置，实现了多功能测试，提高计量的准确性，有助于智能电能表的研发设计，减少了智能电能表的开发成本。
摘要（英）：

The invention discloses a metering chip model selection testing system. The system comprises a power source, a collection module, a metering chip testing module, a digital control power supply module, a communication module, a microprocessor, an interface conversion module and a PC testing system. The microprocessor is connected with the communication module, the interface conversion module and the digital control power supply module separately. The metering chip testing module is connected with the collection module, the digital control power supply module and the interface conversion module separately. The power source is connected with the communication module, the digital control power supply module and the collection module separately. A metering chip testing device provided by the invention achieves multifunctional testing, improves the precision of metering, facilitates R&D and design of intelligent electricity meters, and reduces the development cost of intelligent electricity meters.

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