The invention relates to a fretting wear test device capable of conducting X-ray photoelectron spectroscopy analysis in situ. According to the main structure of the fretting wear test device, the lower middle portion of a force applying rod of a fretting wear test machine and all components below the lower middle portion are wrapped in a vacuum cavity in a sealed mode; a vacuum gauge is installed on the vacuum cavity, the left portion of the vacuum cavity is connected with a vacuum sample introduction cavity of an X-ray photoelectron spectroscopy analysis meter through a connecting pipe, the rear portion of the vacuum cavity is connected with a vacuum pump, and the right portion of the vacuum cavity is connected with a magnetic force rod in a sealed mode; a push rod is sleeved with an inner cavity of the magnetic force rod, and the peripheral face of the magnetic force rod is sleeved with a magnetic ring with magnetism; the right portion of the push rod has magnetism, and a clamping device capable of being clamped with a lower clamp of the fretting wear test machine is installed at the left end of the push rod. After a vacuum fretting wear test is completed, the fretting wear test device can immediately conduct in-situ X-ray photoelectron spectroscopy analysis on a wear crack surface and wear debris components in the same vacuum environment, and the fretting service performance and damage mechanism of materials in the vacuum environment can be obtained more accurately and reliably.