The invention discloses an analog circuit health prediction method, and the method comprises the following steps: collecting a test sample set in a circuit tolerance and faultless mode; calculating the statistical average values of sample vectors in the circuit tolerance and faultless mode; calculating a tolerance voltage increment signal set in the circuit tolerance and faultless mode; calculating a fundamental frequency energy entropy of the tolerance voltage increment signal in the circuit tolerance and faultless mode; calculating the maximum energy entropy of the faultless tolerance voltage increment signal; collecting a voltage signal of a circuit at a to-be-measured moment; calculating the voltage increment signal of the circuit at the to-be-measured moment; calculating the fundamental frequency energy entropy of the voltage increment signal of the circuit at the to-be-measured moment; calculating the health index of the to-be-measured circuit; taking the health index of the circuit as the basis, and judging the health condition of the circuit. The method can analyze the fundamental frequency signal of a testing signal through EWT under the condition that the original measurement information is not lost, and completes the judgment of the health condition of the circuit through calculating the energy entropy of the fundamental frequency signal and the health index of the circuit.