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发明授权
CN106918772B 雷达电路板电应力加速退化方法和装置 有权

雷达电路板电应力加速退化方法和装置
摘要：
本发明涉及可靠性加速试验技术领域，公开一种雷达电路板电应力加速退化方法和装置。该方法包括：获取雷达电路板的最高电压应力水平；根据雷达电路板的最高电压应力水平和加速速率确定试验方案；根据加速试验样本数量选取原则确定试验样本数量；根据所述试验方法、试验设备和所述试验样本数量设计试验系统，并通过所述试验系统进行雷达电路板电应力加速退化试验。该方法通过选用雷达电路板进行电应力加速退化试验能够完整、有效的反映出电子产品的可靠性。
摘要（英）：

The invention relates to the field of reliability accelerating tests, and discloses a radar circuit board electrical stress deterioration accelerating method and apparatus. The method includes the following steps: acquiring the highest voltage stress level of a radar circuit board; on the basis of the highest voltage stress level of the radar circuit board and an acceleration velocity, determining a test plan; on the basis of acceleration test sample number selecting rules, determining the number of test samples; and on the basis of a test method, a test device and the number of test samples, designing a test system, and conducting a radar circuit board electrical stress deterioration accelerating test through the test system. The method can fully and effectively reflect the reliability of electronic products by selecting the radar circuit board to conduct electrical stress deterioration accelerating tests.

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