The invention discloses a Hadoop-based integrated circuit short circuit critical area extraction method. The method comprises the following steps: 1) reading a layout image of an integrated circuit; 2) uploading the layout image of the integrated circuit; 3) storing the layout image of the integrated circuit in a block storage manner; 4) splitting a layout image of each data node; 5) converting the layout image into a Map input key-value pair; 6) carrying out pretreatment on the layout image; 7) extracting a short circuit critical area; 8) setting a Map output key-value pair; 9) setting Reduce; and 10) submitting a task. The method realizes parallel short-circuit critical area extraction of the layout image of the integrated circuit by utilizing a distributed processing framework Hadoop, can finish large-scale integrated circuit short circuit critical area rapid extraction, and can also improve short circuit critical area extraction efficiency of large-scale integrated circuit layout images.