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发明公开
CN107300649A 一种配电器整机加速贮存试验方法及寿命评估方法 无效 - 驳回

一种配电器整机加速贮存试验方法及寿命评估方法
摘要：
本发明提供一种配电器整机加速贮存试验方法及寿命评估方法，配电器加速贮存试验方法，包括：基于所述配电器整机的温度循环加速贮存试验剖面图，对所述配电器整机进行加速贮存试验。本发明提供的配电器加速贮存试验方法，基于温度循环试验剖面，适用于配电器类产品寿命期内规定的库房贮存环境条件，可以在较短的时间内验证配电器类产品贮存寿命，并激发贮存薄弱环节，为配电器类产品研制及定型提供试验方法与评估方法，为验证配电器类产品的贮存寿命提供支撑。
摘要（英）：

The invention provides a distributor whole machine accelerated storage test method and a life evaluation method. The distributor whole machine accelerated storage test method is characterized by, based on a temperature cycle accelerated storage test profile map of a distributor whole machine, carrying out accelerated storage test on the distributor whole machine. The distributor whole machine accelerated storage test method, based on the temperature cycle test profile map, is suitable for warehouse storage environment conditions regulated in life period of distributor products, and can evaluate the storage life of the distributor products in a short time and stimulate storage weak links, thereby providing a test method and an evaluation method for study and design of the distributor products and providing support for storage life of the distributor products.

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