The invention relates to a parameter re-calibration method for a structured light three-dimensional measurement system, and equipment; and an auxiliary camera is added in a system with a camera and a projector to realize re calibration on a parameter inside the projector. A high-precision white flat plate is arranged; the projector projects a structured light pattern; and the original system camera and the auxiliary camera collect a white flat plate pattern. The two cameras are calibrated to obtain the parameter of the auxiliary camera; on the basis of a stereoscopic vision principle, a white flat plate is reconstructed by using a shot picture; a reconstructed point cloud is projected to an emission phase plane of the projector in a back projection mode, a corresponding projection phase is calculated, and a difference between the calculated projection phase and an actual phase to obtain a phase residual difference value; and then on the basis of a principle of least squares, calculation is carried out to obtain error values of a transverse equivalent focal distance and a lateral optical center of the projector, thereby completing re calibration of the parameter inside the projector. Therefore, the calibration accuracy of the structured light three-dimensional measurement system is improved.