利索-全球专利检索

  1. Login
  2. Sign Up
Invention Grant
CN107727654B 膜层检测方法、装置及膜层检测系统 有权

膜层检测方法、装置及膜层检测系统
Abstract:
本发明公开了一种膜层检测方法、装置及膜层检测系统，属于面板制造领域。该膜层检测方法用于检测设置在基板上的至少一层膜层，该膜层检测方法包括：采用光源从基板设置有膜层的一侧进行照射；从基板设置有膜层的一侧，采集膜层图像，该膜层图像包括被照射的至少一层膜层的图像；根据膜层图像的亮度分布，确定至少一层膜层中最上层膜层的类型。本发明通过用光源从基板设置有膜层的一侧照射待处理的基板，在图像采集组件采集膜层图像之后，基于膜层图像的亮度分布，可以确定该至少一层膜层中最上层膜层的类型，从而避免了由于错误膜层导致面板报废或者设备宕机。达到了降低产能损失，提高生产效率的效果。
Abstract(English):

A film layer detection method, a film layer detection device, and a film layer detection system. The film layer detection device comprises: a light source (11), an image acquiring assembly (12), and an image analyzing assembly (13). The light source (11) illuminates the side of a substrate (01) to be detected provided with a film layer (02); the image acquiring assembly (12) acquires an image of the film layer (02) from the side of the substrate (01) provided with the film layer (02), the image of the film layer (02) comprising an image of at least one illuminated film layer (02); the image analyzing assembly (13) determines the type of an uppermost film layer (02) in the at least one film layer (02) according to luminance distribution of the image of the film layer (02).

Public/Granted literature
Patent Agency Ranking
0/0