The invention discloses a single-particle turning and testing system and method orienting a space radiation environment in space application. Based on the characteristic that an SRAM type FPGA is dynamically constructable in combination with the single-particle turning and testing method, according to different testing requirements, extracted data can be subjected to single-bit turning testing ormulti-bit turning testing, wherein a functional FPGA module in the system can also be subjected to functional configuration according to different testing requirements, and the flexibility of the system is high; secondly, by comparing and analyzing output results of to-be-processed system design and standard system design injected into faults, a sensitive area of single-particle turning in systemdesign is obtained, in this way, a single-particle turning resistant reinforcing program is designed, and the reliability and stability of the SRAM type FPGA in space application are improved.