The invention provides an integrated circuit design method and an integrated circuit latch effect test method, and belongs to the technical field of integrated circuit design. The integrated circuit design method comprises the steps that the specified port is selected from the integrated circuit to act as the control end of the latch effect test mode; and the association relationship between the control end and all the ports except for the reset port of the integrated circuit is established so that the control end is enabled to control the state of all the ports except for the reset port in the latch effect test mode. According to the integrated circuit design method and the integrated circuit latch effect test method, the control end of the latch effect test mode is arranged for the integrated circuit, and the state of the ports of the integrated circuit in the latch effect test mode is controlled by using the control end so that the controllability of the internal signal of the circuit can be increased, the requirements of the Latch up test can be better met, the latch effect resistance of the circuit can be objectively and accurately evaluated and the quality of the device can be guaranteed.