The invention discloses a light-emitting device temperature distribution measurement device and measurement method based on microscopy hyper-spectrum, and belongs to the field for testing the light-emitting device temperature distribution. The device comprises a temperature control table, a driving power, a temperature control power, a microscope, a hyper-spectrograph and a computer; the measurement method comprises the following steps: setting initial temperature of a sample, selecting a pulse signal by using the driving power to drive the sample; adjusting the temperature-control power, changing the temperature of the temperature control table, wherein the hyper-spectrograph collects the hyper-spectral data of the sample under the corresponding temperature point; computing a two-dimensional temperature sensitive coefficient matrix according to the hyper-spectral data through the computer; adjusting the driving power to the constant-voltage or constant-current mode, and collecting thehyper-spectral data of the sample by using the hyper-spectrograph; computing centroid wavelength by using the hyper-spectral data under the constant-voltage or constant-current mode through the computer, and obtaining sample surface two-dimensional temperature distribution by combining the two-dimensional temperature sensitive coefficient matrix; obtaining spectrum images of various pixel pointson the surface of the light-emitting device, thereby precisely obtaining the surface two-dimensional temperature distribution diagram of the light-emitting device, and directly reflecting the surfacetemperature change tendency.