The invention provides a method for determining a low-value insulator infrared detection temperature threshold based on inverse Gaussian distribution. The method comprises the steps of: selecting a low-value insulator sample for low-value temperature difference processing to obtain a low-value temperature difference sample of the low-value insulator sample, performing distribution fitting for thelow-value insulator sample, and according to an inverse Gaussian distribution function, performing maximum likelihood estimation to obtain the average temperature difference distribution of the low-value insulator; performing low-value insulator infrared detection omission factor and false drop rate analysis, performing temperature difference valuing for a normal insulator at the corresponding position of the low-value insulator, and drawing and generating a temperature threshold-omission factor curve and a temperature threshold-false drop rate curve in the same chart; and selecting a low-value insulator infrared detection temperature threshold, wherein the temperature difference threshold corresponding to an intersection point between the temperature threshold-omission factor curve and the temperature threshold-false drop rate curve is namely the low-value insulator infrared detection temperature threshold. The method provided by the invention improves the accuracy in the low-value insulator infrared detection process.