The invention discloses a temperature control device for material low-temperature surface characteristic research. The temperature control device is composed of a semiconductor refrigeration system, acold circulation system and a refrigeration sheet control system, wherein the semiconductor refrigeration system is divided into two stages, and is composed of a first-stage semiconductor refrigeration system and a second-stage semiconductor refrigeration system; the cold circulation system consists of a first-stage cold circulation system and a second-stage cold circulation system; and the refrigeration piece control system is composed of a temperature sensor and a mainboard. The temperature control device has the advantages of being small in size, low in power, low in cost, and therefore simple to implement; and a low-temperature environment can be created conveniently by only a power supply, and a low-temperature condition can be provided for a laboratory without an environment-controllable atomic force microscope.