The invention is a kind of nano particle microscope, which mainly includes a host machine, a primary controller and detector. The information of particles acquired by the probe of the detector is transmitted to the host machine after preprocessed by the preprocessor in the detector. After passing through the figure diagram processing model, figure diagram analysis model, particle statistic model and observation and displaying model, the figure of the particle can be displayed on the screen. It can acquire accurate statistic data. Thus, the invention has functions observing particle's figure diagram and statistic particle data. The resolution can reach nano grade, the measuring precision is less than 0.5 nano.