The utility model relates to a heat resistance quick batch screening device of a power semiconductor LED (Light-emitting Diode), belonging to the technical field of heat resistance examination and screening of semiconductor LEDs and related PN-knot devices. The device comprises heat contact plates, detected device clamping plates and a probe table, wherein the each contact plate comprises an upper layer and a lower layer: an upper plate and a lower layer, the required number of holes for testing the LEDs are drilled in the lower plate, circular holes which have the same size as those of the lenses at the light outgoing ends of the LEDs are formed in the detected device clamp plates, the diameter ends at the two sides of each circular hole are symmetrically and respectively outwards carved with a square notch, the side wall of each notch is provided with two electrodes which are up-to-down communicated, the light outgoing ends of the LEDs face downwards, the base ends of the LEDs face upwards, the base ends of the LEDs align to a small cylinder, the positions of the probe table, which correspond to the two electrodes of each LED, are fixedly connected with two probes which face upwards, a spring is respectively arranged under each probe, the probes outwards lead out the electrodes of each LED, and the electrodes are connected in probe inserting interfaces of the probe table through the leads on the probe table.