的测试装置的输出的测试信号（PS1）具有时间偏移小于/等于取决于测试装置的值的结构。 与所述测试装置（A），（5），以进行检查，则必须提供给测试信号的样本，所述时间偏移量小于所述时间由所述测试设备（PS1）供给的测试信号的偏移定位，它是测试装置（A）和所述间 被测装置（5）插入的装置（B）。 这包括一个发射器（12）和反并联连接于所述接收器（13）。 所述发射器（12）切换测试设备的测试信号（PS1）仅作为测试信号（PS2）的测试对象（5）中，当一个时钟信号（S1），并且在发射器（12）一个转换信号（T3）。 时钟信号（S1）可以以简单的方式制造以可确定的时间，因此没有大的偏移设置的测试信号（PS2）的发生时间。 所述接收器（13）与时钟信号（S3）的辅助下，并通过一个开关（T3）导通，并输出从从输出的DUT（5）所估计的响应信号（AS）。 对于所述接收器（13），以及通过延迟装置（14,15，16）装置，用于从一时钟信号（S0）的发射器（12）所恢复的时钟信号（S1）的aktsignal（S3）。

ie emitted by a testing A test signals (PS1) have a temporal offset, the / the same is less to wear, depending on the design of the test facility value. Target with the test apparatus (A), a sample (5) to be checked, must be supplied to the test signals, the temporal offset is less than the temporal offset of the test signals supplied by the testing device (PS1), it is between the test device (A) and the DUT (5) an arrangement (B) inserted. This includes a transmitter (12) and an anti-parallel therewith receiver (13). The transmitter (12) on the test signal (PS1) of the test facility only as a test signal (PS2) to the test object (5), when a clock signal (S1) and a switching signal (T3) at the transmitter (12). The clock signal (S1) can be easily generated at a definable time and thus the time of occurrence of the test signals (PS2) set without large offset. The receiver (13) is turned on by means of a clock signal (S3) and a switch (T3), and then outputs the estimated response signal (AS) from the test piece (5) at the exit from. The clock signal (S3) for the receiver (13) as well as the clock signal (S1) for the transmitter (12) from a clock signal (SO) with the aid of delay means (14, 15, 16) recovered.