发明公开
EP0137045A1 TAPED SEMICONDUCTOR ELEMENTS 失效
带状半导体元件

  • 专利标题: TAPED SEMICONDUCTOR ELEMENTS
  • 专利标题(中): 带状半导体元件
  • 申请号: EP84900751.3
    申请日: 1984-02-10
  • 公开(公告)号: EP0137045A1
    公开(公告)日: 1985-04-17
  • 发明人: MATSUMOTO, ShigeoIGARASHI, Tsutomu
  • 申请人: SONY CORPORATION
  • 申请人地址: 7-35 Kitashinagawa 6-chome Shinagawa-ku Tokyo 141 JP
  • 专利权人: SONY CORPORATION
  • 当前专利权人: SONY CORPORATION
  • 当前专利权人地址: 7-35 Kitashinagawa 6-chome Shinagawa-ku Tokyo 141 JP
  • 代理机构: Cotter, Ivan John
  • 优先权: JP21183/83 19830210
  • 国际公布: WO8403194 19840816
  • 主分类号: H05K13/00
  • IPC分类号: H05K13/00 B65D73/02
TAPED SEMICONDUCTOR ELEMENTS
摘要:
A structure of a tape of consecutive semiconductor elements is constructed so that each of N consecutive semiconductor elements from the nth element to the (n + N-1)th element has a characteristic within a predetermined characteristic deviation range, and also each of N consecutive elements from the (n + 1)th element to the (n + Nlth element has a characteristic within that characteristic deviation range. Thus, when assembling a circuit or device using N elements starting from an element at any desired position, e.g., when using N elements from the nth element to the (n + N-1)th element, if, for example, the nth element is defective because of an error in mounting or another problem, it is possible to assemble the circuit or device using the N elements from the (n + 1)th element to the (n + N)th element.
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