TAPED SEMICONDUCTOR ELEMENTS
    1.
    发明授权
    TAPED SEMICONDUCTOR ELEMENTS 失效
    带状半导体元件

    公开(公告)号:EP0137045B1

    公开(公告)日:1988-05-18

    申请号:EP84900751.3

    申请日:1984-02-10

    申请人: SONY CORPORATION

    IPC分类号: H05K13/00 B65D73/02

    CPC分类号: H05K13/0038

    摘要: A structure of a tape of consecutive semiconductor elements is constructed so that each of N consecutive semiconductor elements from the nth element to the (n+N-1)th element has a characteristic within a predetermined characteristic deviation range, and also each of N consecutive elements from the (n+1)th element to the (n+N)th element has a characteristic within that characteristic deviation range. Thus, when assembling a circuit or device using N elements starting from an element at any desired position, e.g., when using N elements from the nth element to the (n+N-1)th element, if, for example, the nth element is defective because of an error in mounting or another problem, it is possible to assemble the circuit or device using the N elements from the (n+1)th element to the (n+N)th element.

    TAPED SEMICONDUCTOR ELEMENTS
    2.
    发明公开
    TAPED SEMICONDUCTOR ELEMENTS 失效
    带状半导体元件

    公开(公告)号:EP0137045A1

    公开(公告)日:1985-04-17

    申请号:EP84900751.3

    申请日:1984-02-10

    申请人: SONY CORPORATION

    IPC分类号: H05K13/00 B65D73/02

    CPC分类号: H05K13/0038

    摘要: A structure of a tape of consecutive semiconductor elements is constructed so that each of N consecutive semiconductor elements from the nth element to the (n + N-1)th element has a characteristic within a predetermined characteristic deviation range, and also each of N consecutive elements from the (n + 1)th element to the (n + Nlth element has a characteristic within that characteristic deviation range. Thus, when assembling a circuit or device using N elements starting from an element at any desired position, e.g., when using N elements from the nth element to the (n + N-1)th element, if, for example, the nth element is defective because of an error in mounting or another problem, it is possible to assemble the circuit or device using the N elements from the (n + 1)th element to the (n + N)th element.

    摘要翻译: 连续半导体元件的带结构被构造为使得从第n个元件到第(n + N-1)个元件的N个连续半导体元件中的每一个具有在预定特性偏差范围内的特性,并且还具有N个连续 从第(n + 1)个元件到第(n + Nl个)元件的元件具有在该特性偏差范围内的特性。因此,当在任何期望位置组装使用N个元件的电路或设备时, 从第n个元件到第(n + N-1)个元件的N个元件(例如,如果第n个元件由于安装错误或其他问题而有缺陷),可以使用N 从第(n + 1)个元素到第(n + N)个元素的元素。