发明公开
EP0141751A2 Process for determining the basis weight of a low atomic number material in a mixture with a higher atomic number material 失效
一种用于确定具有低原子序数,它是在具有hochatomzahligen材料的混合物的材料的单位面积重量的方法。

  • 专利标题: Process for determining the basis weight of a low atomic number material in a mixture with a higher atomic number material
  • 专利标题(中): 一种用于确定具有低原子序数,它是在具有hochatomzahligen材料的混合物的材料的单位面积重量的方法。
  • 申请号: EP84402212.9
    申请日: 1984-11-05
  • 公开(公告)号: EP0141751A2
    公开(公告)日: 1985-05-15
  • 发明人: Hegland, Philip M.Dahlquist, John
  • 申请人: MEASUREX CORPORATION
  • 申请人地址: One Results Way Cupertino, California 95014 US
  • 专利权人: MEASUREX CORPORATION
  • 当前专利权人: MEASUREX CORPORATION
  • 当前专利权人地址: One Results Way Cupertino, California 95014 US
  • 代理机构: Mongrédien, André (FR)
  • 优先权: US549026 19831107
  • 主分类号: G01N23/08
  • IPC分类号: G01N23/08 G01N23/16
Process for determining the basis weight of a low atomic number material in a mixture with a higher atomic number material
摘要:
The invention relates to an apparatus and a process for determining the relative quantity of a low atomic number material in a mixture of the material and a high atomic number material.
The apparatus comprises a first source (16) for directing a first beam of X rays into the mixture, a second source (20) for directing a second beam of X rays into the mixture, a first and a second detectors (34, 36) for detecting respectively the first and second beams in the absence of the mixture and for detecting respectively the portion of the first and second beams transmitted through the mixture. The apparatus also comprises a computer (60) coupled to the first and second detectors to determine, upon the detected beams, the relative quantity of the low atomic number material.
Application to the measurement of the concentration of binder material in fiber glass.
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