发明公开
- 专利标题: Method of treating photoresists
- 专利标题(中): 光致抗蚀剂的处理方法
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申请号: EP86116308申请日: 1986-11-25
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公开(公告)号: EP0233333A3公开(公告)日: 1988-02-24
- 发明人: Tanaka, Kazuya , Ueki, Kazuyoshi , Suzuki, Hiroko , Mimura, Yoshiki , Suzuki, Shinji , Sugioka, Shinji
- 申请人: USHIO DENKI
- 专利权人: USHIO DENKI
- 当前专利权人: USHIO DENKI
- 优先权: JP2877486 19860214
- 主分类号: G03F07/26
- IPC分类号: G03F07/26
摘要:
Ultraviolet radiation process applies to manufacture semiconductor devices in order to enhance the thermal stability of the photoresist film of semiconductors wafers. A method, in ultraviolet radiation process, enabling effective treatment of the photoresist employing ultraviolet irradiation by preventing the deformation of the photoresist which is caused by exposing it to high ultraviolet radiation at the beginning of exposure. This method employs ultraviolet irradiation, in which the photoresist is exposed to ultraviolet radiation of low intensity at the beginning of exposure, and then exposed to ultraviolet radiation,the intensity of which increases little by little or in steps.
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