发明公开
- 专利标题: Film thickness-measuring apparatus using linearly polarized light
- 专利标题(中): 使用线性偏振光的薄膜厚度测量装置
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申请号: EP87108476.0申请日: 1987-06-12
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公开(公告)号: EP0249235A3公开(公告)日: 1989-03-15
- 发明人: Sano, Kazuo c/o Patent & License , Miyazaki, Takao c/o Patent & License , Yamada, Yoshiro c/o Patent & License
- 申请人: NIPPON KOKAN KABUSHIKI KAISHA
- 申请人地址: 1-2 Marunouchi 1-chome Chiyoda-ku Tokyo 100 JP
- 专利权人: NIPPON KOKAN KABUSHIKI KAISHA
- 当前专利权人: NIPPON KOKAN KABUSHIKI KAISHA
- 当前专利权人地址: 1-2 Marunouchi 1-chome Chiyoda-ku Tokyo 100 JP
- 代理机构: Sajda, Wolf E., Dipl.-Phys.
- 优先权: JP137458/86 19860613; JP179145/86 19860730
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G01N21/21
摘要:
A linearly polarized light beam is applied to the surface of a film (9b) and is reflected therefrom. The beam is then split into three light beams by three or four optical flats (13a - 13d). These light beams are applied to photoelectric conversion devices (18a - 18c) after passing through analyzers (14a - 14c) with fixed analyzing angles. The photoelectric conversion devices convert the beams into electric signals representing the intensities of these light beams. Two ellipsometric parameters ψ and Δ are calculated from these three electric signals.
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