Film thickness-measuring apparatus using linearly polarized light
    3.
    发明公开
    Film thickness-measuring apparatus using linearly polarized light 失效
    线性极化仪Licht。

    公开(公告)号:EP0249235A2

    公开(公告)日:1987-12-16

    申请号:EP87108476.0

    申请日:1987-06-12

    IPC分类号: G01B11/06 G01N21/21

    CPC分类号: G01B11/065 G01N21/211

    摘要: A linearly polarized light beam is applied to the surface of a film (9b) and is reflected therefrom. The beam is then split into three light beams by three or four optical flats (13a - 13d). These light beams are applied to photoelectric conversion devices (18a - 18c) after passing through analyzers (14a - 14c) with fixed analyzing angles. The photoelectric conversion devices convert the beams into electric signals representing the intensities of these light beams. Two ellipsometric parameters ψ and Δ are calculated from these three electric signals.

    摘要翻译: 将线偏振光束施加到膜(9b)的表面并从其反射。 然后将光束通过三个或四个光学平面(13a-13d)分成三个光束。 这些光束通过具有固定分析角度的分析器(14a-14c)后被施加到光电转换装置(18a-18c)。 光电转换装置将光束转换成表示这些光束强度的电信号。 从这三个电信号计算出两个椭偏参数psi和DELTA。