发明公开
EP0260060A1 Self-aligned bipolar fabrication process
失效
Selbstausrichtendes Herstellungsverfahrenfürbipolare Halbleiterbauelemente。
- 专利标题: Self-aligned bipolar fabrication process
- 专利标题(中): Selbstausrichtendes Herstellungsverfahrenfürbipolare Halbleiterbauelemente。
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申请号: EP87307756.4申请日: 1987-09-02
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公开(公告)号: EP0260060A1公开(公告)日: 1988-03-16
- 发明人: Welbourn, Anthony David , Heslop, Christopher John Hedley
- 申请人: BRITISH TELECOMMUNICATIONS public limited company
- 申请人地址: 81 Newgate Street London EC1A 7AJ GB
- 专利权人: BRITISH TELECOMMUNICATIONS public limited company
- 当前专利权人: BRITISH TELECOMMUNICATIONS public limited company
- 当前专利权人地址: 81 Newgate Street London EC1A 7AJ GB
- 代理机构: Roberts, Simon Christopher
- 优先权: GB8621534 19860908
- 主分类号: H01L21/285
- IPC分类号: H01L21/285 ; H01L21/00 ; H01L29/72
摘要:
Regions of the substrate which are to be the collector sinker and the active area of a bipolar transistor are isolated by forming a trench about them and filling it with a dielectric. The dielectric can be oxide formed in a LOCOS process. A dielectric body, which may be nitride, is formed on part of the active area, and base contacts implanted using it as a mask. Polysilicon is deposited over the whole and then cut to form future metallisation-to-base contacts. The dielectric body is removed and the base implanted through the resulting aperture. Oxide spacers are formed on the sidewall of the aperture and polysilicon deposited. The polysilicon is doped and used to produce the emitter by driving the dopant into the substrate between the oxide spacers.
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