发明公开
EP0273628A1 Process for production of semiconductor devices
失效
Verfahren zur Produktion von Halbleiteranordnungen。
- 专利标题: Process for production of semiconductor devices
- 专利标题(中): Verfahren zur Produktion von Halbleiteranordnungen。
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申请号: EP87310963.1申请日: 1987-12-14
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公开(公告)号: EP0273628A1公开(公告)日: 1988-07-06
- 发明人: Kobayashi, Masanori
- 申请人: FUJITSU LIMITED
- 申请人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
- 代理机构: Billington, Lawrence Emlyn
- 优先权: JP302118/86 19861217
- 主分类号: H01L21/306
- IPC分类号: H01L21/306 ; B65B55/22
摘要:
A process for the production of semiconductor devices which comprises washing a cleaned semiconductor substrate (1) with or without one or more component parts formed thereon, with pure water (4), freezing pure water containing the washed substrate, preserving and/or transporting the ice(14)-covered substrate, and thawing and drying the substrate (7) before a subsequent process. The production process of the present invention can remove contamination on a surface of the semiconductor substrate in a wafer process and can inhibit the formation of a natural oxide coating on a surface of the substrate, thus shortening and simplifying the wafer process, increasing the quality and yield of the semiconductor devices, and enabling the cleaned substrate to be preserved for a long period and transported to distant areas or far countries.
公开/授权文献
- EP0273628B1 Process for production of semiconductor devices 公开/授权日:1992-03-18
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