Invention Grant
- Patent Title: Self-testing memory arrangement and method
- Patent Title (中): 自检存储器布置和方法
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Application No.: EP88304331.7Application Date: 1988-05-13
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Publication No.: EP0292206B1Publication Date: 1993-09-29
- Inventor: Lipcon, Jesse B. , Maskas, Barry A. , Morgan, David K.
- Applicant: DIGITAL EQUIPMENT CORPORATION
- Applicant Address: 146 Main Street Maynard, MA 01754 US
- Assignee: DIGITAL EQUIPMENT CORPORATION
- Current Assignee: DIGITAL EQUIPMENT CORPORATION
- Current Assignee Address: 146 Main Street Maynard, MA 01754 US
- Agency: Goodman, Christopher
- Priority: US49812 19870514
- Main IPC: G11C29/00
- IPC: G11C29/00
Public/Granted literature
- EP0292206A1 Self-testing memory arrangement and method Public/Granted day:1988-11-23
Information query
