发明公开
- 专利标题: X-ray analysis apparatus
- 专利标题(中): Röntgenanalysegerät。
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申请号: EP93308932.8申请日: 1993-11-09
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公开(公告)号: EP0597668A1公开(公告)日: 1994-05-18
- 发明人: Yellepeddi, Ravisekhar , Bapst, Alexandre , Negro, Pierre-Yves
- 申请人: FISONS plc
- 申请人地址: Fison House Princes Street Ipswich Suffolk IP1 1QH GB
- 专利权人: FISONS plc
- 当前专利权人: FISONS plc
- 当前专利权人地址: Fison House Princes Street Ipswich Suffolk IP1 1QH GB
- 代理机构: Tomlinson, Kerry John
- 优先权: GB9223592 19921111
- 主分类号: G01N23/22
- IPC分类号: G01N23/22 ; G01N23/207 ; G01N23/223
摘要:
A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray ; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.
公开/授权文献
- EP0597668B1 X-ray analysis apparatus 公开/授权日:2002-04-03
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