INSPECTION DEVICE AND INSPECTION METHOD
    3.
    发明公开

    公开(公告)号:EP4474804A1

    公开(公告)日:2024-12-11

    申请号:EP22924090.8

    申请日:2022-11-29

    Inventor: TSUKAMOTO, Takeo

    Abstract: An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.

    INSPECTION DEVICE AND INSPECTION METHOD
    4.
    发明公开

    公开(公告)号:EP4474803A1

    公开(公告)日:2024-12-11

    申请号:EP22924089.0

    申请日:2022-11-29

    Inventor: TSUKAMOTO, Takeo

    Abstract: An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to an inspection target surface of the inspection target object, an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X ray generation portion and totally reflected by the inspection target surface, and an adjustment mechanism configured to adjust a relative position between the inspection target surface and the X-ray detector.

    INSPECTION DEVICE AND INSPECTION METHOD
    5.
    发明公开

    公开(公告)号:EP4474800A1

    公开(公告)日:2024-12-11

    申请号:EP22923964.5

    申请日:2022-03-31

    Inventor: TSUKAMOTO, Takeo

    Abstract: An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

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