发明公开
- 专利标题: Method and apparatus for monitoring crack growth
- 专利标题(中): 对裂纹扩展的控制方法和装置。
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申请号: EP94304292.9申请日: 1994-06-14
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公开(公告)号: EP0631123A3公开(公告)日: 1996-11-06
- 发明人: Diaz, Thomas Pompilio , Andresen, Peter Louis , Catlin, William Ramsay , Contreras, Gary William , De Lair, Ronald Edward , Miller, William Dale , Solomon, Harvey Donald , Weinstein, Daniel
- 申请人: GENERAL ELECTRIC COMPANY
- 申请人地址: 1 River Road Schenectady, NY 12345 US
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: 1 River Road Schenectady, NY 12345 US
- 代理机构: Lupton, Frederick
- 优先权: US83140 19930625
- 主分类号: G01N3/08
- IPC分类号: G01N3/08
摘要:
An apparatus and a method for measuring and controlling the crack growth rate within a double cantilever beam type test specimen (50). The arms (51,52) of the test specimen are fitted with a pressure-actuated bellows (62) to induce a predetermined load and with a sensing assembly (70) to provide feedback on the amount of beam displacement resulting from application of that load. In this manner a loaded test specimen may be remotely mounted and adjusted inside the reactor pressure vessel or piping of a nuclear reactor in order to maintain a stress intensity which is constant or which varies in a predetermined manner for inducing stress corrosion cracking or corrosion fatigue in the specimen.
公开/授权文献
- EP0631123A2 Method and apparatus for monitoring crack growth 公开/授权日:1994-12-28
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