发明公开
EP0639006A1 Multiplexed control pins for in-system programming and boundary scan testing using state machines in a high density programmable logic device 失效
复用操作的控制端子,用于在系统内编程和在高集成度的可编程逻辑电路由机器的装置的边界扫描测试。

Multiplexed control pins for in-system programming and boundary scan testing using state machines in a high density programmable logic device
摘要:
A structure and a method to implement in-system programming (ISP) and boundary-scan testing in an integrated circuit using the same pins to control both functions. The SDI, SCLK, MODE and SDO connections required for in-system programming and the TDI, TCK, TMS and TDO connections required for boundary-scan testing are multiplexed such that they are provided from the same four pins. An in-system programming enable pin is used to control the multiplexing of these pins.
In an alternative embodiment, both in-system programming and boundary-scan testing are performed using the same pins and the same state machine. The test logic architecture specified in IEEE Standard 1149.1-1990 is utilized. To implement the in-system programming instructions, the instruction register of Std. 1149.1-1990 is modified to include private instructions which perform the desired programming functions.
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