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    Multiplexed control pins for in-system programming and boundary scan testing using state machines in a high density programmable logic device
    1.
    发明公开
    Multiplexed control pins for in-system programming and boundary scan testing using state machines in a high density programmable logic device 失效
    复用操作的控制端子，用于在系统内编程和在高集成度的可编程逻辑电路由机器的装置的边界扫描测试。

    公开(公告)号：EP0639006A1

    公开(公告)日：1995-02-15

    申请号：EP94202212.0

    申请日：1994-07-28

    申请人： LATTICE SEMICONDUCTOR CORPORATION

    发明人： Tsui, Cyrus Y ,  Chan, Albert L ,  Shankar, Kapil ,  Shen, Ju

    IPC分类号： H03K19/173

    CPC分类号： G06F17/5054 ,  G01R31/318555 ,  G01R31/318558 ,  G01R31/318572 ,  G06F1/22 ,  H03K19/1732 ,  H03K19/1737

    摘要： A structure and a method to implement in-system programming (ISP) and boundary-scan testing in an integrated circuit using the same pins to control both functions. The SDI, SCLK, MODE and SDO connections required for in-system programming and the TDI, TCK, TMS and TDO connections required for boundary-scan testing are multiplexed such that they are provided from the same four pins. An in-system programming enable pin is used to control the multiplexing of these pins.
    In an alternative embodiment, both in-system programming and boundary-scan testing are performed using the same pins and the same state machine. The test logic architecture specified in IEEE Standard 1149.1-1990 is utilized. To implement the in-system programming instructions, the instruction register of Std. 1149.1-1990 is modified to include private instructions which perform the desired programming functions.

    摘要翻译： 的结构和方法来实现在系统编程（ISP）和边界扫描使用相同的销，以控制这两个功能上的集成电路测试英寸 用于系统内编程和TDI，TCK，TMS和用于边界扫描测试所需TDO连接所需的SDI，SCLK，MODE和SDO连接是从相同的四个引脚提供thatthey多路复用求。 一种在系统编程使能引脚被用于控制的论文引脚的多路复用。 在一个替代实施例中，在系统内编程和边界扫描测试使用相同的销和相同的状态机来执行。 在IEEE标准1149.1-1990中规定的测试逻辑体系结构被利用。 为了实现在系统编程指令，标准1149.1-1990的指令寄存器被修改为包括执行所需的编程功能专用的指令。