发明公开
EP0841701A1 Component characteristics measurement circuit in an integrated semiconductor circuit system
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- 专利标题： Component characteristics measurement circuit in an integrated semiconductor circuit system
- 专利标题（中）： on ung ung ung ung ung ung ung ung ung ung ung ung ung ung ung ung ung ung
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申请号： EP97119272.9申请日： 1997-11-04
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公开(公告)号： EP0841701A1公开(公告)日： 1998-05-13
- 发明人: Shou, Guoliang , Motohashi, Kazunori , Yamamoto, Makoto
- 申请人： YOZAN INC.
- 申请人地址： 3-5-18, Kitazawa, Setagaya-ku Tokyo 155 JP
- 专利权人： YOZAN INC.
- 当前专利权人： YOZAN INC.
- 当前专利权人地址： 3-5-18, Kitazawa, Setagaya-ku Tokyo 155 JP
- 代理机构： Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权： JP310171/96 19961106
- 主分类号： H01L27/08
- IPC分类号： H01L27/08 ; G01R31/316
摘要：
The present invention provides a circuit enable to measure the component characteristics deviation of an integrated semiconductor circuit system. It has the structure that an input impedance and a feedback impedance are connected to an inverting amplifying circuit consisting of an odd number of stages of inverters. Enough impedance units are connected to make one of them the reference impedance and another the measurement object, known voltage is input to the inverting amplifying circuit, and its output is measured from the outside of the integrated semiconductor circuit system.
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