发明授权

  • 专利标题: SUCKED MATERIAL DETECTOR, SUCKED MATERIAL DETECTING METHOD USING THE SAME DETECTOR, SHIFT DETECTING METHOD USING THE SAME DETECTOR, AND CLEANING METHOD USING THE SAME DETECTOR
  • 专利标题(中): 吸入型物质探测器和方法,测定方法的错误和清洁过程的定向使用该探测器
  • 申请号: EP97924239.3
    申请日: 1997-05-28
  • 公开(公告)号: EP0907311B1
    公开(公告)日: 2003-12-03
  • 发明人: FURUTA, Katsunobu
  • 申请人: Advantest Corporation
  • 申请人地址: 32-1, Asahicho 1-chome Nerima-ku, Tokyo 179 JP
  • 专利权人: Advantest Corporation
  • 当前专利权人: Advantest Corporation
  • 当前专利权人地址: 32-1, Asahicho 1-chome Nerima-ku, Tokyo 179 JP
  • 代理机构: Bérogin, Francis
  • 优先权: JP13877896 19960531; JP13372497 19970523
  • 国际公布: WO97046071 19971204
  • 主分类号: H05K13/08
  • IPC分类号: H05K13/08
SUCKED MATERIAL DETECTOR, SUCKED MATERIAL DETECTING METHOD USING THE SAME DETECTOR, SHIFT DETECTING METHOD USING THE SAME DETECTOR, AND CLEANING METHOD USING THE SAME DETECTOR
摘要:
This detector is provided with a suction transfer arm (12) for vacuum sucking an object material (11) at a nozzle bore and transferring the material in the horizontal and vertical directions. On the rear side of the portion of a stage (13) on which the material (11) to be sucked is placed, an upwardly directed light-emitting sensor (14) is provided. The portion of the stage on which the material (11) to be sucked is placed is provided with a through hole by which the upward rays of light-emitting sensor (14) is not shut off. At an inner part of the nozzle bore of the suction transfer arm (12), a downwardly directed light receiving sensor (15) for receiving the rays of light from the light-emitting sensor (14) is provided.
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