发明公开
- 专利标题: Multilevel Interconnect Structure
- 专利标题(中): Verbindungsstruktur in mehreren Ebenen
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申请号: EP98830562.9申请日: 1998-09-25
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公开(公告)号: EP0989609A1公开(公告)日: 2000-03-29
- 发明人: Pio, Federico
- 申请人: STMicroelectronics S.r.l.
- 申请人地址: Via C. Olivetti, 2 20041 Agrate Brianza (Milano) IT
- 专利权人: STMicroelectronics S.r.l.
- 当前专利权人: STMicroelectronics S.r.l.
- 当前专利权人地址: Via C. Olivetti, 2 20041 Agrate Brianza (Milano) IT
- 代理机构: Cerbaro, Elena, Dr.
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; H01L21/768
摘要:
The integrated device comprises, in combination: a first conductive region (6); a first insulating region (7) of dielectric material, covering the first conductive region; a first through region (15) of electrically conductive material, extending inside the first insulating region (7), and in direct electrical contact with the first conductive region (6); a second conductive region (10a), arranged above the first insulating region (7), in a position not aligned and not in contact with the first through region (15); a second insulating region (9) of dielectric material, covering the second conductive region (10a); a second through region (21) of electrically conductive material, extending inside the second insulating region (9) as far as the first through region (15), aligned and in direct electrical contact with the first through region; and a third conductive region (11a), arranged above the second insulating region (9), aligned and in direct electrical contact with the second through region (21).
公开/授权文献
- EP0989609B1 Multilevel Interconnect Structure 公开/授权日:2005-02-09
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