发明公开
- 专利标题: Multilayered wafer with thrick sacrificial layer using porous silicon or porous silicon oxide and fabrication method thereof
- 专利标题(中): 多层光盘用厚牺牲层采用多孔硅或多孔硅和制造过程
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申请号: EP00106011.0申请日: 2000-03-27
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公开(公告)号: EP1041621A3公开(公告)日: 2004-11-24
- 发明人: Kang, Sung-gyu , Lee, Ki Bang , Choi, Jae-joon , Jeong, Hee-moon
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: 416, Maetan-dong, Paldal-gu Suwon-City, Kyungki-do KR
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: 416, Maetan-dong, Paldal-gu Suwon-City, Kyungki-do KR
- 代理机构: Patentanwälte Ruff, Wilhelm, Beier, Dauster & Partner
- 优先权: KR9911269 19990331
- 主分类号: H01L21/205
- IPC分类号: H01L21/205 ; H01L21/20 ; H01L21/3063 ; H01L21/316 ; H01L21/762
摘要:
A multilayered wafer with a thick sacrificial layer, which is obtained by forming a sacrificial layer of oxidized porous silicon or porous silicon and growing an epitaxial polysilicon layer on the sacrificial layer, and a fabrication method thereof are provided. The multilayered wafer with a thick sacrificial layer adopts a porous silicon layer or an oxidized porous silicon layer as a sacrificial layer such that a sufficient gap can be obtained between a substrate and a suspension structure upon the manufacture of the suspension structure of a semiconductor actuator or a semiconductor inertia sensor. Also, in a fabrication method of the wafer according to the present invention, a p + -type or n + -type wafer doped at a high concentration is prepared for, and then a thick porous silicon layer can be obtained simply by anodic-bonding the surface of the wafer. Also, when polysilicon is grown on a porous silicon layer by an epitaxial process, it is grown faster than when single crystal silicon is grown.
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