发明公开
- 专利标题： INTEGRATED CIRCUIT TESTER WITH AMORPHOUS LOGIC
- 专利标题（中）： 无定形LOGIC ICT测试仪
-
申请号： EP99927320.4申请日： 1999-06-07
-
公开(公告)号： EP1095287A1公开(公告)日： 2001-05-02
- 发明人: SLIZYNSKI, Roman, A. , DINTEMAN, Bryan, J.
- 申请人： CREDENCE SYSTEMS CORPORATION
- 申请人地址： 215 Fourier Avenue Fremont, CA 94539 US
- 专利权人： CREDENCE SYSTEMS CORPORATION
- 当前专利权人： CREDENCE SYSTEMS CORPORATION
- 当前专利权人地址： 215 Fourier Avenue Fremont, CA 94539 US
- 代理机构： Swindell & Pearson
- 优先权： US96812 19980612
- 国际公布： WO9964881 19991216
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A general purpose integrated circuit (I) tester (10) includes a set of channels (18), one for each input or output pin of an I device under test (DUT) (12). Each channel (18) is programmed by a host computer (22) to either supply a test signal to a DUT I/O pin (14, 16) or sample a DUT output signal appearing at the I/O pin (14, 16) and produce sample data representing its magnitude or logic state. The tester (10) also includes an amorphous logic circuit (ALC) (30) having a set of input and output terminals (28) and a programmable logic circuit interconnecting the input and output terminals. Some of the ALC input and output terminals (28) receive the sample data produced by each channel (18) and other ALC terminals send control signals directly to each channel (18). Other ALC terminals transmit data to the host computer (22).
信息查询
