发明公开
- 专利标题： INTEGRIERTE SCHALTUNG MIT EINER SELBSTTESTEINRICHTUNG ZUR DURCHFÜHRUNG EINES SELBSTTESTS DER INTEGRIERTEN SCHALTUNG
- 专利标题（英）： Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit
- 专利标题（中）： 具有自试验装置具体实施自测试的集成电路的集成电路
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申请号： EP99945908.4申请日： 1999-07-05
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公开(公告)号： EP1097460A2公开(公告)日： 2001-05-09
- 发明人: KAISER, Robert , SCHAMBERGER, Florian
- 申请人： Infineon Technologies AG
- 申请人地址： St.-Martin-Strasse 53 81669 München DE
- 专利权人： Infineon Technologies AG
- 当前专利权人： Infineon Technologies AG
- 当前专利权人地址： St.-Martin-Strasse 53 81669 München DE
- 代理机构： MÜLLER & HOFFMANN Patentanwälte
- 优先权： DE19833208 19980723
- 国际公布： WO0005723 20000203
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
The invention relates to an integrated circuit comprising a self-test device (B) for executing a self-test of the integrated circuit which has a control output (CTR). The integrated circuit also comprises a program memory (MI) which is connected to the self-test device and which is provided for storing at least one test program (P) that is supplied from outside the integrated circuit. Said test program is ran by the self-test device during the execution of a self-test. The self-test device (B) controls the loading of the respective test program to be ran into the program memory from outside the integrated circuit via the control output (CTR) thereof.
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