发明公开
EP1119017A2 Vault shaped target and high-field magnetron
审中-公开
GewölbtesTarget和Magnetron mit starkem Feld
- 专利标题: Vault shaped target and high-field magnetron
- 专利标题(中): GewölbtesTarget和Magnetron mit starkem Feld
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申请号: EP01300337.1申请日: 2001-01-16
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公开(公告)号: EP1119017A2公开(公告)日: 2001-07-25
- 发明人: Gopalraja, Parburam , Fu, Jianming , Chen, Fusen , Dixit, Girish , Xu, Zheng , Athreya, Sankaram , Wang, Wei D. , Sinha, Ashok K.
- 申请人: APPLIED MATERIALS, INC.
- 申请人地址: 3050 Bowers Avenue, M/S 2061 Santa Clara, California 95052 US
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: 3050 Bowers Avenue, M/S 2061 Santa Clara, California 95052 US
- 代理机构: Bayliss, Geoffrey Cyril
- 优先权: US490026 20000121; US518180 20000302; US703601 20001101
- 主分类号: H01J37/34
- IPC分类号: H01J37/34
摘要:
The disclosure relates to a target and magnetron for a plasma sputter reactor (10). The target (12) has an annular vault (18) facing the wafer (20) to be sputter coated. Various types of magnetic means positioned around the vault create a magnetic field supporting a plasma extending over a large volume of the vault. Preferably, the magnetron (14) includes annular magnets (32) of opposed polarities disposed behind the two vault sidewalls (22, 24) and a small closed unbalanced magnetron of nested magnets (30) of opposed polarities scanned along the vault roof. An integrated copper via filling process with the inventive reactor or other reactor includes a first step of highly ionized sputter deposition of copper, which can optionally be used to remove the barrier layer at the bottom of the via, a second step of more neutral, lower-energy sputter deposition of copper to complete the seed layer, and a third step of electroplating copper into the hole to complete the metallization. The first two steps can be also used with barrier metals.
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