发明公开
- 专利标题: Method of holding substrate and substrate holding system
- 专利标题(中): 保持方法和系统保持用于在基板
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申请号: EP01107801.1申请日: 1994-09-02
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公开(公告)号: EP1119023A3公开(公告)日: 2006-06-07
- 发明人: Tamura, Naoyuki , Takahashi, Kazue , Ito, Youichi , Ogawa, Yoshifumi , Shichida, Hiroyuki , Tsubone, Tsunehiko
- 申请人: Hitachi, Ltd.
- 申请人地址: 6 Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100-8010 JP
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: 6 Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100-8010 JP
- 代理机构: Lang, Johannes
- 优先权: JP23018793 19930916; JP4828694 19940318
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
Present invention provides a method of holding substrate and a substrate holding system where the amount of foreign substances on the back surface can be decreased, and a little amount of foreign substances may be transferred from a mounting table to a substrate. The substrate holding system comprises a ring-shaped leakage-proof surface having smooth surface on the specimen table corresponding to the periphery of the substrate, a plurality of contact holding portions against the substrate on the specimen table between the corresponding position to the periphery of the substrate and the corresponding position to the center of the substrate, and electrostatic ttraction means for fixing the substrate by contacting the back surface of the substrate to the ring-shaped leakage-proof surface and the contact holding portions. The substrate contacts to the cooling surface at the ring-shaped leakage-proof surface and the contact holding portion placed on a position inside the ring-shaped leakage-proof surface. The back surface of the substrate and the cooling surface do not contact to each other in the large portion of the remaining area.
公开/授权文献
- EP1119023A2 Method of holding substrate and substrate holding system 公开/授权日:2001-07-25
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