发明公开
- 专利标题: BUILT-IN SELF TEST FOR INTEGRATED DIGITAL-TO-ANALOG CONVERTERS
- 专利标题(中): 内建自测试为一体的数字模拟转换器
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申请号: EP00959483.9申请日: 2000-08-28
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公开(公告)号: EP1151540A1公开(公告)日: 2001-11-07
- 发明人: MICHEL, Jean-Yves
- 申请人: Koninklijke Philips Electronics N.V. , Philips Semiconductors Inc.
- 申请人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 专利权人: Koninklijke Philips Electronics N.V.,Philips Semiconductors Inc.
- 当前专利权人: Koninklijke Philips Electronics N.V.,Philips Semiconductors Inc.
- 当前专利权人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 代理机构: Duijvestijn, Adrianus Johannes
- 优先权: US419465 19991015
- 国际公布: WO0129971 20010426
- 主分类号: H03M1/10
- IPC分类号: H03M1/10
摘要:
A circuit arrangement (10, 110) and method for testing the differential non-linearity (DNL) of a digital-to-analog converter (DAC) (20, 120) determines whether the digital-to-analog converter has an analog output (22, 122) that is monotonic, and thus the DAC is functional. The design is appropriate for being implemented on an integrated circuit containing a digital-to-analog converter, creating an efficient self-test circuit arrangement. A counter (12, 112) generates a monotonic sequence of digital input codes for a digital input of the digital-to-analog converter. A monotonicity comparator (24, 24', 24'', 124), such as a one-stage or multistage sample and hold circuit arrangement, detects any non-monotonic transition in the analog output of the digital-to-analog converter, generating an error signal as an output. An output switch, such as a digital flip-flop (37', 37'', 137), may be set by the error signal, for monitoring by other devices. A clock signal synchronizes the counter and the monotonicity comparator. A reset signal may be included to reset the counter to the first digital input code in the sequence. The reset may also reset the output switch.
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