发明公开
EP1158303A1 A circuit for measuring absolute spread in capacitors implemented in planary technology
审中-公开
在平面执行电路,用于测量绝对散射能力
- 专利标题: A circuit for measuring absolute spread in capacitors implemented in planary technology
- 专利标题(中): 在平面执行电路,用于测量绝对散射能力
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申请号: EP00201821.6申请日: 2000-05-25
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公开(公告)号: EP1158303A1公开(公告)日: 2001-11-28
- 发明人: Kasperkowitz, Wolfdietrich George
- 申请人: Semiconductor Ideas to The Market (ItoM) BV
- 申请人地址: Drielindendreef 53 4839 AH Breda NL
- 专利权人: Semiconductor Ideas to The Market (ItoM) BV
- 当前专利权人: Semiconductor Ideas to The Market (ItoM) BV
- 当前专利权人地址: Drielindendreef 53 4839 AH Breda NL
- 代理机构: Van Straaten, Joop
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; G01R31/316
摘要:
A circuit for measuring absolute spread in capacitors implemented in planary technology using a charge pump (CP) supplying a charge current to an internal capacitor (Cint), the voltage across the internal capacitor (Cint) being coupled through a comparator (COM) for comparing said voltage with first and second threshold levels to a bistable multivibrator (BM) for reversing the direction of the charge current to charge the internal capacitor (Cint) when said voltage decreases below the second threshold level and to decharge the internal capacitor (Cint), when said voltage increases above the first threshold level, the charge current being determined by a reference voltage being provided across an external resistor (Rext), said first and second threshold levels defining a voltage range being proportional to the reference voltage, an output signal of the bistable multivibrator being coupled to frequency measuring means (CFM) to compare the repetition frequency thereof with a reference frequency.
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