发明公开
- 专利标题: Equipment for communication system and semiconductor integrated circuit device
- 专利标题(中): 的通信系统和半导体集成电路装置的设备
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申请号: EP01127726.6申请日: 2001-11-21
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公开(公告)号: EP1209740A3公开(公告)日: 2008-03-19
- 发明人: Yokogawa, Toshiya , Takahashi, Kunimasa , Uchida, Masao , Kitabatake, Makoto , Kusumoto, Osamu
- 申请人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD
- 申请人地址: 1006, Oaza Kadoma Kadoma-shi, Osaka 571-8501 JP
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD
- 当前专利权人地址: 1006, Oaza Kadoma Kadoma-shi, Osaka 571-8501 JP
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: JP2000353699 20001121
- 主分类号: H01L21/82
- IPC分类号: H01L21/82 ; H01L27/06
摘要:
Equipment for a communication system has a semiconductor device formed by integrating a Schottky diode, a MOSFET, a capacitor, and an inductor in a SiC substrate. The SiC substrate has a first multilayer portion and a second multilayer portion provided upwardly in this order. The first multilayer portion is composed of δ-doped layers each containing an n-type impurity (nitrogen) at a high concentration and undoped layers which are alternately stacked. The second multilayer portion is composed of δ - doped layers each containing a p-type impurity (aluminum) at a high concentration and undoped layers which are alternately stacked. Carriers in the δ -doped layers spread out extensively to the undoped layers. Because of a low impurity concentration in each of the undoped layers, scattering by impurity ions is reduced so that a low resistance and a high breakdown voltage are obtained.
公开/授权文献
- EP1209740B1 Equipment for communication system 公开/授权日:2017-03-15
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