发明公开
EP1351097A2 System and method for calibrating a laser line illumination system for use in imaging systems 审中-公开
系统和方法,用于校准激光线照射系统用于在成像系统中使用的

  • 专利标题: System and method for calibrating a laser line illumination system for use in imaging systems
  • 专利标题(中): 系统和方法,用于校准激光线照射系统用于在成像系统中使用的
  • 申请号: EP03100927.7
    申请日: 2003-04-07
  • 公开(公告)号: EP1351097A2
    公开(公告)日: 2003-10-08
  • 发明人: Allen, RoyKiermeier, ArnfriedNolan, John
  • 申请人: Agfa Corporation
  • 申请人地址: 100 Challenger Road Ridgefield Park, NJ 07660-2199 US
  • 专利权人: Agfa Corporation
  • 当前专利权人: Agfa Corporation
  • 当前专利权人地址: 100 Challenger Road Ridgefield Park, NJ 07660-2199 US
  • 代理机构: Van Ostaeyen, Marc Albert Jozef
  • 优先权: US117393 20020405
  • 主分类号: G03F9/00
  • IPC分类号: G03F9/00
System and method for calibrating a laser line illumination system for use in imaging systems
摘要:
A calibration system is disclosed for use with an imaging system including a laser line illumination source (10). The calibration system includes an imaging head (16), a mask (24) having a calibration opening (26) through which a portion of the line of laser illumination (10) may pass, and a calibration unit (20). The imaging head (16) is movable along a slow scan direction with respect to an imaging surface (18) for imaging a line of laser illumination (22) in the slow scan direction. The calibration opening (26) has a width in the slow scan direction that is larger than a full width half maximum distance of an imaging spot of a smallest addressable picture element of the line of laser illumination (22). The calibration unit (20) is for receiving a portion of the line of laser illumination (22) through the calibration opening (26) and for processing the received portion of the line of laser illumination (22).
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