发明公开
EP1365209A1 METHOD FOR MEASURING GAP OF LIQUID CRYSTAL CELL
有权
VERFAHREN ZUR MESSUNG DES PLATTENABSTANDS EINERFLÜSSIGKRISTALLZELLE
- 专利标题: METHOD FOR MEASURING GAP OF LIQUID CRYSTAL CELL
- 专利标题(中): VERFAHREN ZUR MESSUNG DES PLATTENABSTANDS EINERFLÜSSIGKRISTALLZELLE
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申请号: EP01902815.8申请日: 2001-02-09
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公开(公告)号: EP1365209A1公开(公告)日: 2003-11-26
- 发明人: AKADA, Tomohiro , TAKIZAWA, Masaya
- 申请人: OTSUKA ELECTRONICS CO., LTD.
- 申请人地址: 26-3, Shodai-tajika, 3-chome Hirakata-shi Osaka 573-1132 JP
- 专利权人: OTSUKA ELECTRONICS CO., LTD.
- 当前专利权人: OTSUKA ELECTRONICS CO., LTD.
- 当前专利权人地址: 26-3, Shodai-tajika, 3-chome Hirakata-shi Osaka 573-1132 JP
- 代理机构: HOFFMANN EITLE
- 国际公布: WO02065053 20020822
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G02F1/13
摘要:
The polarization angle θ1 of a polarizer (14) is set, and the reflection intensity S1 in a cross Nicol state and the reference reflection intensity Ref1 of a liquid crystal cell (15) are measured. A different polarization angle θ2 is then set, and the reflection intensity S2 in a cross Nicol state and the reference reflection intensity Ref2 of the liquid crystal cell are measured. The rations S1/Ref1, S2/Ref2 of measured intensities and the ratio S1 · Ref2/S2 · Ref1 is determined in order to cancel the background components of the reference reflection intensities Ref1, Ref2 thus determining the value of cell gap accurately (Fig. 1).
公开/授权文献
- EP1365209B1 METHOD FOR MEASURING GAP OF LIQUID CRYSTAL CELL 公开/授权日:2011-10-05
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