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    OPTICAL MEASUREMENT APPARATUS, AND OPTICAL MEASUREMENT METHOD
    2.
    发明公开
    OPTICAL MEASUREMENT APPARATUS, AND OPTICAL MEASUREMENT METHOD 审中-公开

    公开(公告)号：EP3425370A1

    公开(公告)日：2019-01-09

    申请号：EP18179798.6

    申请日：2018-06-26

    申请人： Otsuka Electronics Co., Ltd.

    发明人： Izutani, Yusuke ,  Wakayama, Ikuo

    IPC分类号： G01N15/02 ,  G01N21/51 ,  G01N15/00 ,  G01N21/01 ,  G01N21/53

    摘要： An optical measurement apparatus (1, 201, 301) includes a main body base (10), an optical base (11) movably combined with the main body base (10), a measurement optical system (30) fixed to the optical base (11), and an optical base moving mechanism (21)which moves the optical base (11) relative to the main body base (10). The optical base moving mechanism (21) moves the optical base (11) relative to the main body base (10) between an internal measurement position (11A) and an external measurement position (11B). At the internal measurement position (11A), a measurement object position (30a) of the measurement optical system (30) coincides with an internal measurement object position (30A) within the main body base (10). At the external measurement position (11B), a measurement object position (30a) of the measurement optical system (30) coincides with an external measurement object position (30B) outside the main body base (10).

    MICROSPECTROSCOPE INCLUDING OPTICAL FIBERS AND SPECTROSCOPE
    7.
    发明公开
    MICROSPECTROSCOPE INCLUDING OPTICAL FIBERS AND SPECTROSCOPE 审中-公开
    MIKROSPEKTROSKOP EISSCHLIESSLICH OPTISCHER FASERN UND SPEKTROSKOP

    公开(公告)号：EP3136086A1

    公开(公告)日：2017-03-01

    申请号：EP16180465.3

    申请日：2016-07-21

    申请人： Otsuka Electronics Co., Ltd.

    发明人： SHIRAIWA, Hisashi

    IPC分类号： G01N21/64 ,  G02B21/00 ,  G01N21/65 ,  G01J3/02 ,  G01J3/44

    CPC分类号： G01J3/28 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/44 ,  G01J3/4406 ,  G01N21/6452 ,  G01N21/6458 ,  G01N21/65 ,  G01N2021/6484 ,  G01N2201/0833 ,  G01N2201/0846 ,  G02B21/0032 ,  G02B21/004 ,  G02B21/0064

    摘要： A microspectroscope (101) includes: a light source (11, 17); a plurality of light projecting optical fibers (12) that receive light from the light source (11, 17); a spectroscope (1); a plurality of light receiving optical fibers (22) for guiding received light to the spectroscope (1); and a confocal optical system (5) for causing each of a plurality of beams from the plurality of light projecting optical fibers (12) to be condensed and irradiated onto a sample, and forming images of a plurality of beams from a plurality of condensing points on the sample, respectively on the plurality of light receiving optical fibers (22).

    摘要翻译： 显微光谱仪（101）包括：光源（11,17）; 多个从所述光源（11,17）接收光的投光光纤（12）; 分光仪（1）; 多个光接收光纤（22），用于将接收的光引导到所述分光器（1）; 以及共焦光学系统（5），用于使来自所述多个投光光纤（12）的多个光束中的每一个被聚集并照射到样本上，并且从多个聚光点形成多个光束的图像 分别在多个受光光纤（22）上。

    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD
    8.
    发明公开
    QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD 有权
    量子效率测量装置和量子效率测量方法

    公开(公告)号：EP2315003A1

    公开(公告)日：2011-04-27

    申请号：EP09709437.9

    申请日：2009-01-20

    申请人： Otsuka Electronics Co., Ltd.

    发明人： OHKUBO, Kazuaki

    IPC分类号： G01N21/64

    CPC分类号： G01N21/645 ,  G01J3/0254 ,  G01J3/0262 ,  G01N21/276 ,  G01N2021/6417 ,  G01N2201/0655

    摘要： A sample (OBJ1) that is an object whose quantum efficiency is to be measured, and a standard object (REF1) having a known reflectance characteristic are each attached to a sample window (2) provided in a plane mirror (5). Based on respective spectrums measured by a spectrometer in respective cases where the sample (OBJ1) is attached and the standard object (REF1) is attached, the quantum efficiency of the sample (OBJ1) is measured. The plane of an opening of an observation window (3) is made substantially coincident with the exposed surface of the sample (OBJ1) or standard object (REF1), so that direct incidence, on the observation window (3), of the fluorescence generated from the sample (OBJ1) receiving an excitation light (L1) and the excitation light (L1) reflected from sample (OBJ1) is prevented.

    摘要翻译： 将作为量子效率被测量对象的样品（OBJ1）和具有已知反射特性的标准物（REF1）分别附着到设置在平面镜（5）中的样品窗口（2）。 基于分别安装样本（OBJ1）和标准物体（REF1）的情况下通过光谱仪测量的各个光谱，测量样本（OBJ1）的量子效率。 观察窗（3）的开口的平面基本上与样品（OBJ1）或标准物（REF1）的暴露表面重合，从而在观察窗（3）上直接入射产生的荧光 从接收激发光（L1）的样本（OBJ1）和从样本（OBJ1）反射的激发光（L1）被阻止。

    SPECTRUM MEASURING INSTRUMENT
    9.
    发明授权
    SPECTRUM MEASURING INSTRUMENT 有权
    仪的测量频谱

    公开(公告)号：EP1340059B1

    公开(公告)日：2005-03-02

    申请号：EP01938734.9

    申请日：2001-06-19

    申请人： OTSUKA ELECTRONICS CO., LTD.

    发明人： OKA, Kouichi ,  OKAWAUCHI, Makoto

    IPC分类号： G01J3/28

    CPC分类号： G01J3/2803 ,  G01J3/28

    摘要： In a spectrum measuring instrument of the present invention, a detecting surface (13a) of a detector (13) is a two-dimensional detecting surface and spectrum light coming out from a spectroscope is irradiated to a region A on the detecting surface (13a). Signal intensity at the regions on the detecting surface (13a) other than the region A where the spectrum light is irradiated is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed (Fig. 4).

    INSTRUMENT FOR MEASURING LIGHT SCATTERING
    10.
    发明公开
    INSTRUMENT FOR MEASURING LIGHT SCATTERING 审中-公开
    MESSGERÄTFÜRLICHTSTREUUNG

    公开(公告)号：EP1134578A1

    公开(公告)日：2001-09-19

    申请号：EP99972735.7

    申请日：1999-11-15

    申请人： OTSUKA ELECTRONICS CO., LTD.

    发明人： AKAGI, Motonobu ,  TSUTSUI, Kazunori ,  MIZUGUCHI, Tsutomu ,  SEKIWA, Mitsunao

    IPC分类号： G01N21/49

    CPC分类号： G01N21/474 ,  G01N21/51 ,  G01N2021/4726 ,  G01N2021/4769

    摘要： An instrument for measuring light scattering of the present invention includes an incident optical fiber 4 for irradiating light to a sample and a scattered light measuring optical fiber 6 for collecting scattered light to be propagated, and the claddings 24 and 28 of the respective optical fibers 4 and 6 are opposed to each other directly at a predetermined angle of 90° within a sample cell (Fig. 1). This configuration provides a simple and highly reliable instrument for measuring light scattering.

    摘要翻译： 本发明的测量光散射的仪器包括用于向样品照射光的入射光纤4和用于收集要传播的散射光的散射光测量光纤6和各光纤4的包层24和28 和6在样品池内以预定的90度角直接相对（图1）。 该配置提供了一种用于测量光散射的简单且高度可靠的仪器。