发明公开
EP1365218A2 Wavelength meter for swept lasers 有权
Wellenlängemessvorrichtungfürfrequencyenzgewobbelten激光

  • 专利标题: Wavelength meter for swept lasers
  • 专利标题(中): Wellenlängemessvorrichtungfürfrequencyenzgewobbelten激光
  • 申请号: EP03253114.7
    申请日: 2003-05-19
  • 公开(公告)号: EP1365218A2
    公开(公告)日: 2003-11-26
  • 发明人: Anderson, Duwayne R.
  • 申请人: Tektronix, Inc.
  • 申请人地址: 14200 S.W. Karl Braun Drive, P.O. Box 500 Beaverton, OR 97077 US
  • 专利权人: Tektronix, Inc.
  • 当前专利权人: Tektronix, Inc.
  • 当前专利权人地址: 14200 S.W. Karl Braun Drive, P.O. Box 500 Beaverton, OR 97077 US
  • 代理机构: Molyneaux, Martyn William
  • 优先权: US155383 20020524
  • 主分类号: G01J9/00
  • IPC分类号: G01J9/00
Wavelength meter for swept lasers
摘要:
A swept wavelength meter provides a real-time wavelength calibration scheme for a swept laser. The calibration scheme generates an electrical signal from a swept optical output of the swept laser that is cyclical with respect to the wavelength of the swept optical output over a defined range of wavelengths. The point on the electrical signal at any given time provides an accurate phase for the swept optical output at that point. The electrical signal in turn is calibrated by generating calibration references from the swept optical output using known absorption lines within the defined range of interest. The wavelength of the swept laser is calibrated as a function of a reference wavelength from the known absorption lines and the phase at the given point. Simultaneously forward and reflective measurements may be taken, with the forward measurement being used as a normalizing measurement for determining insertion and return loss automatically for a device under test.
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