WAVEFRONT MEASURING APPARATUS AND WAVEFRONT MEASURING METHOD FOR SENSING A LIGHT FIELD AND RECONSTRUCTING A WAVEFRONT THEREOF

    公开(公告)号:EP4428509A1

    公开(公告)日:2024-09-11

    申请号:EP23160204.6

    申请日:2023-03-06

    Abstract: A wavefront measuring apparatus 100 for sensing a light field 1, in particular of laser pulses, travelling along an optical axis (z) and having a lateral extension parallel to an optical plane (x-y) perpendicular to the optical axis, and for reconstructing a wavefront of the light field 1 with spatial and spectral resolution in the optical plane, comprises a wavefront encoding device 10 for receiving the light field 1 to be measured and for creating a hypercube 2 of light patterns encoding a phase of the wavefront by an intensity modulation in the optical plane and having spectral resolution within said optical plane, a wavefront sensing device 20 for capturing three dimensional wavefront data by single shot compressive imaging of the hypercube 2 of light patterns with a two dimensional light sensor 23, and a wavefront reconstructing device 30 for a neural network, in particular deep unrolling, based reconstruction of the wavefront of the light field 1 from the wavefront data. Furthermore, a wavefront measuring method and applications of measuring the wavefront are disclosed.

    SPECTROSCOPIC POLARIMETER AND DEVICE FOR AUTOMATICALLY ADJUSTING OPTICAL PATH DIFFERENCE

    公开(公告)号:EP4053523A1

    公开(公告)日:2022-09-07

    申请号:EP20881005.1

    申请日:2020-04-06

    Applicant: MGEN.CO,.LTD

    Inventor: PARK, Min Young

    Abstract: A spectropolarimetric apparatus according to an embodiment of the present invention includes a light source attachment/detachment unit to which a light source is detachably coupled, a polarization interferometer configured to split light emitted from the light source coupled to the light source attachment/detachment unit into a plurality of polarized light beams using a polarization beam splitter and irradiate at least some of the split polarized light beams to a reflective sample to output the reflected light, and a spectrometer configured to measure physical properties of the reflective sample by analyzing the output light, wherein a wavelength of the light source coupled to the light source attachment/detachment unit varies depending on the reflective sample.

Patent Agency Ranking