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公开(公告)号:EP3924711B1
公开(公告)日:2025-05-07
申请号:EP20765572.1
申请日:2020-03-05
Inventor: Baudat, Gaston Daniel
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2.
公开(公告)号:EP4428509A1
公开(公告)日:2024-09-11
申请号:EP23160204.6
申请日:2023-03-06
Applicant: Ludwig-Maximilians-Universität München
Inventor: DÖPP, Andreas , HOWARD, Sunny , NORREYS, Peter
CPC classification number: G01J9/00 , G01J9/0215 , G01J2009/022320130101 , G01J2009/023420130101
Abstract: A wavefront measuring apparatus 100 for sensing a light field 1, in particular of laser pulses, travelling along an optical axis (z) and having a lateral extension parallel to an optical plane (x-y) perpendicular to the optical axis, and for reconstructing a wavefront of the light field 1 with spatial and spectral resolution in the optical plane, comprises a wavefront encoding device 10 for receiving the light field 1 to be measured and for creating a hypercube 2 of light patterns encoding a phase of the wavefront by an intensity modulation in the optical plane and having spectral resolution within said optical plane, a wavefront sensing device 20 for capturing three dimensional wavefront data by single shot compressive imaging of the hypercube 2 of light patterns with a two dimensional light sensor 23, and a wavefront reconstructing device 30 for a neural network, in particular deep unrolling, based reconstruction of the wavefront of the light field 1 from the wavefront data. Furthermore, a wavefront measuring method and applications of measuring the wavefront are disclosed.
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公开(公告)号:EP3443399B1
公开(公告)日:2024-08-21
申请号:EP17720694.3
申请日:2017-04-12
CPC classification number: G02B21/002 , G02B21/0056 , G02B21/0076 , G02B26/06 , A61B5/0059 , G02B21/0072
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公开(公告)号:EP4285113A1
公开(公告)日:2023-12-06
申请号:EP22792458.6
申请日:2022-04-21
Applicant: KLA Corporation
Inventor: MENGEL, Markus
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公开(公告)号:EP3553903B1
公开(公告)日:2023-04-12
申请号:EP17878420.3
申请日:2017-12-04
Inventor: UENO, Masahiro , CHIN, Meishin , TATSUMI, Shoko , SAKAMOTO, Takashi , SASAKI, Yuzo , TOYODA, Seiji , AKAGE, Yuichi , YAMAGUCHI, Joji , SAKAMOTO, Tadashi
IPC: H01S3/107 , H01S5/0687 , G01B9/02091 , G01B9/02004 , G01J9/00 , H01S5/06 , H01S5/062 , H01S5/14
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公开(公告)号:EP4103920A1
公开(公告)日:2022-12-21
申请号:EP21703719.1
申请日:2021-02-10
Applicant: Consiglio Nazionale Delle Ricerche
Inventor: MALARA, Pietro , GAGLIARDI, Gianluca , GIORGINI, Antonio , AVINO, Saverio , DE NATALE, Paolo
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公开(公告)号:EP3853653B1
公开(公告)日:2022-10-05
申请号:EP19790655.5
申请日:2019-09-17
Inventor: DARSON, David , DUBOIS, Julien , COLAS, François
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8.
公开(公告)号:EP4053523A1
公开(公告)日:2022-09-07
申请号:EP20881005.1
申请日:2020-04-06
Applicant: MGEN.CO,.LTD
Inventor: PARK, Min Young
Abstract: A spectropolarimetric apparatus according to an embodiment of the present invention includes a light source attachment/detachment unit to which a light source is detachably coupled, a polarization interferometer configured to split light emitted from the light source coupled to the light source attachment/detachment unit into a plurality of polarized light beams using a polarization beam splitter and irradiate at least some of the split polarized light beams to a reflective sample to output the reflected light, and a spectrometer configured to measure physical properties of the reflective sample by analyzing the output light, wherein a wavelength of the light source coupled to the light source attachment/detachment unit varies depending on the reflective sample.
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公开(公告)号:EP3982426A1
公开(公告)日:2022-04-13
申请号:EP21206422.4
申请日:2013-04-05
Applicant: Universidad Complutense De Madrid
Inventor: SÁNCHEZ RAMOS, Celia
Abstract: Method, product and blocking element of short wavelengths in LED-type light sources consisting of a substrate with a pigment distributed on its surface and, in that said pigment has an optical density such that it allows the selective absorption of short wavelengths between 380 nm and 500 nm in a range between 1 and 99%.
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公开(公告)号:EP3730917B1
公开(公告)日:2022-03-09
申请号:EP18901530.8
申请日:2018-01-19
Inventor: SUZUKI, Masataka , YANAGISAWA, Takayuki , ITAKURA, Shigetaka , ANADA, Takayasu
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