发明公开
EP1425594A1 MULTILEVEL SIGNAL INTERFACE TESTING WITH BINARY TEST APPARATUS BY EMULATION OF MULTILEVEL SIGNALS
无效
二进制测试者从仿真更多电平信号更多电平信号接口测试
- 专利标题： MULTILEVEL SIGNAL INTERFACE TESTING WITH BINARY TEST APPARATUS BY EMULATION OF MULTILEVEL SIGNALS
- 专利标题（中）： 二进制测试者从仿真更多电平信号更多电平信号接口测试
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申请号： EP02798942.5申请日： 2002-09-09
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公开(公告)号： EP1425594A1公开(公告)日： 2004-06-09
- 发明人: WERNER, Carl, W. , ZERBE, Jared, L. , STOENCYPHER, William, F. , LIAW, Haw-Jyh , CHANG, Timothy, C.
- 申请人： Rambus Inc.
- 申请人地址： 4440 El Camino Real Los Altos,California 94022 US
- 专利权人： Rambus Inc.
- 当前专利权人： Rambus Inc.
- 当前专利权人地址： 4440 El Camino Real Los Altos,California 94022 US
- 代理机构： Freeman, Jacqueline Carol
- 优先权： US953486 20010914; US953514 20010914
- 国际公布： WO2003025600 20030327
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/26 ; G06F11/00
摘要：
Error detection mechanisms (400) for devices (300) that have multilevel signal interfaces (330) test multilevel signals of an interface with a binary test apparatus(404). The error detection mechanisms include converting between multilevel signals of the interface and binary signals of the test apparatus. The error detection mechanisms also include repeated transmission of multilevel signals stored in a memory of a device having a multilevel signal interface for detection by the test apparatus at different binary levels.
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