发明公开
EP1439572A2 Method of manufacturing group III nitride substrate
审中-公开
赫尔斯特朗·赫尔斯特伦(Gravpe-III-Nitrid-Substrats)
- 专利标题: Method of manufacturing group III nitride substrate
- 专利标题(中): 赫尔斯特朗·赫尔斯特伦(Gravpe-III-Nitrid-Substrats)
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申请号: EP04250264.1申请日: 2004-01-20
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公开(公告)号: EP1439572A2公开(公告)日: 2004-07-21
- 发明人: Kitaoka, Yasuo , Kidoguchi, Isao , Minemoto,Hisashi , Ishibashi, Akihiko
- 申请人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 申请人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 代理机构: Matthews, Derek Peter
- 优先权: JP2003011569 20030120
- 主分类号: H01L21/208
- IPC分类号: H01L21/208 ; H01L21/78
摘要:
The present invention provides a manufacturing method that makes it possible to manufacture a substrate that is formed of high-quality Group III nitride crystals alone and has less warping. A Group III nitride layer (a seed layer 12 and a selective growth layer 15) including gaps is formed on a substrate (a sapphire substrate 11). In an atmosphere containing nitrogen, the surface of the Group III nitride layer is brought into contact with a melt containing alkali metal and at least one Group III element selected from gallium, aluminum, and indium, and thereby the at least one Group III element and the nitrogen are made to react with each other to grow Group III nitride crystals (GaN crystals 16) on the Group III nitride layer. Thereafter, a part including the substrate and a part including the Group III nitride crystals are separated from each other in the vicinities of the gaps.
公开/授权文献
- EP1439572A3 Method of manufacturing group III nitride substrate 公开/授权日:2008-03-26
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