发明公开
EP1444955A1 METHOD AND DEVICE FOR SPECIFYING AFFECTED PARTS 审中-公开
VERFAHREN UND VORRICHTUNG ZUR SPEZIFIZIERUNG VON BETROFFENEN TEILEN

  • 专利标题: METHOD AND DEVICE FOR SPECIFYING AFFECTED PARTS
  • 专利标题(中): VERFAHREN UND VORRICHTUNG ZUR SPEZIFIZIERUNG VON BETROFFENEN TEILEN
  • 申请号: EP01274707.7
    申请日: 2001-11-14
  • 公开(公告)号: EP1444955A1
    公开(公告)日: 2004-08-11
  • 发明人: Sakamoto, Noriyasu
  • 申请人: Sakamoto, Noriyasu
  • 申请人地址: 38-15, Doshida 2-chome, Nerima-ku Tokyo 179-0076 JP
  • 专利权人: Sakamoto, Noriyasu
  • 当前专利权人: Sakamoto, Noriyasu
  • 当前专利权人地址: 38-15, Doshida 2-chome, Nerima-ku Tokyo 179-0076 JP
  • 代理机构: Staudt, Hans-Peter, Dipl.-Ing.
  • 国际公布: WO2003041588 20030522
  • 主分类号: A61B10/00
  • IPC分类号: A61B10/00
METHOD AND DEVICE FOR SPECIFYING AFFECTED PARTS
摘要:
A method of specifying affected parts characterized by comprising the steps of detecting radiation emitted from a human body in a pinpointed manner by a radiation detector (1), inputting a detected radiation dose or intensity to a computer (3), and displaying radiation doses or intensities at respective portions of the body on a body distribution diagram on a monitor screen (4). The above radiation doses or intensities are measured while the radiation detector (1) is being gradually distanced from the body, and maximum distances at which the radiation detector can detect radiation rays are set as measurements, thereby obtaining data simply.
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