A three-dimensional shape-measuring device capable of easily and accurately grasping a condition of an object. A three-dimensional shape-measuring device is constituted of a first three-dimensional sensor (10a) having a projection device (11) for projecting pattern light to an object region and a (first) imaging device (12a) positioned with a first spacing (d1) from the projection device (11) and imaging the object region to which the pattern light is projected, a second three-dimensional sensor (10b) having the projection device (11) and a (second) imaging device (12b) positioned with a second spacing (d2), larger than the first spacing (d1), from the projection device (11) and imaging the object region to which the pattern light is projected, three-dimensional information-calculating means (22) for obtaining outline information of the object (2) based on movement of a pattern on an image obtained by the three-dimensional sensor (10a), variation information-calculating means (23) for obtaining variation information of the object (2) based on movement of a pattern on an image obtained by the second three-dimensional sensor (10b), and information-synthesizing means (24) for synthesizing the outline information and the variation information.